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Naslov:A ǂFramework for applying data-driven AI/ML models in reliability
Avtorji:ID Hribar, Rok, Institut Jožef Stefan (Avtor)
ID Antoniou, Margarita, Institut Jožef Stefan (Avtor)
ID Papa, Gregor, Institut Jožef Stefan (Avtor)
Datoteke:URL URL - Izvorni URL, za dostop obiščite https://link.springer.com/chapter/10.1007/978-3-031-59361-1_12
 
.pdf PDF - Predstavitvena datoteka. (497,12 KB, Vsebina dokumenta nedostopna do 22.04.2026)
MD5: EDA00360935E968892AF14DE5913FB82
 
Jezik:Angleški jezik
Tipologija:1.16 - Samostojni znanstveni sestavek ali poglavje v monografski publikaciji
Organizacija:Logo IJS - Institut Jožef Stefan
Povzetek:In this chapter, we present a framework for applying artificial intelligence (AI)/machine learning (ML) in reliability, in the context of the iRel40 project. Data-driven models are becoming an increasingly fruitful tool for detecting patterns in complex data and identifying the circumstances in which they occur. Using only data, gathered along the value chain, data-driven methods are now being used to detect indications of potential early failures, signs of wear out or degradation, and other unwanted events within the development, fabrication, or service phases of the electronic components and systems. We present general considerations that were found to be important during the iRel40 project, when designing pipelines that combine data processing with the AI/ML models for predicting or detecting reliability issues. This chapter serves as an introduction to the definitions and concepts used within the specific use cases that rely on the AI/ML methodology within the iRel40 project.
Ključne besede:machine learning, artificial intelligence, data-driven models
Status publikacije:Objavljeno
Verzija publikacije:Recenzirani rokopis
Datum objave:22.04.2024
Založnik:Springer
Leto izida:2024
Št. strani:1 spletni vir (1 PDF dokument (323–337 str.))
Izvor:Švica
PID:20.500.12556/DiRROS-19675 Novo okno
UDK:004.8
DOI:10.1007/978-3-031-59361-1_12 Novo okno
COBISS.SI-ID:202399235 Novo okno
Avtorske pravice:© 2024 The Author(s), under exclusive license to Springer Nature Switzerland AG
Opomba:Nasl. z nasl. zaslona; Opis vira z dne 22. 7. 2024;
Datum objave v DiRROS:23.07.2024
Število ogledov:236
Število prenosov:96
Metapodatki:XML DC-XML DC-RDF
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Gradivo je del monografije

Naslov:Recent Advances in Microelectronics Reliability : Contributions from the European ECSEL JU Project IRel40
Uredniki:Willem Dirk van Driel
Kraj izida:Cham
Založnik:Springer Nature
ISBN:978-3-031-59361-1
COBISS.SI-ID:202391555 Novo okno

Gradivo je financirano iz projekta

Financer:ARIS - Javna agencija za znanstvenoraziskovalno in inovacijsko dejavnost Republike Slovenije
Številka projekta:P2-0098
Naslov:Računalniške strukture in sistemi

Financer:EC - European Commission
Program financ.:H2020
Številka projekta:876659
Naslov:Intelligent Reliability 4.0
Akronim:iRel40

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