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Title: Introducing EIS circuit elements in SPICE simulator environment Authors: ID Kunaver, Matevž (Author) Files: PDF - Presentation file, download (578,10 KB) MD5: BA3FB0EA68AF8BB0775FE7114C0A1238   URL - Source URL, visit https://ojs.midem-drustvo.si/index.php/InfMIDEM/article/view/2144   URL - Source URL, visit https://ojs.midem-drustvo.si/index.php/InfMIDEM/article/view/2144   This document has even more files. Complete list of files is available below. Language: English Typology: 1.01 - Original Scientific Article Organization: MIDEM - Society for Microelectronics, Electronic Components and Materials Abstract: This study introduces hypothetical circuit elements, specifically the Constant Phase Element (CPE) and Zeroth-Order Approximation of a RC Circuit (ZARC), into the SPICE circuit simulation environment to enhance Electrochemical Impedance Spectroscopy (EIS) analysis. EIS, a critical method for understanding electrochemical processes in fields such as fuel cell analysis, corrosion studies, and biomaterials, relies on fitting measured impedance curves to Equivalent Electrical Circuit (EEC) models. However, existing approaches require expert knowledge and significant mathematical effort, limiting automation. By integrating CPE and ZARC into SPICE, this work bridges the gap between EIS analysis and advanced automatic circuit design methodologies, enabling efficient model selection and parameter determination. Experimental results demonstrate the accuracy of the implemented elements through a series of case studies, evaluated using Sheppard’s criteria function. This integration marks a significant step toward automated EIS model fitting and optimization, with potential implications for advancing electrochemical and materials research. Keywords: electrochemical impedance spectroscopy, circuit simulators, hypothetical circuit elements, equivalent electronic circuits Publication status: Published Publication version: Version of Record Publication date: 01.01.2025 Year of publishing: 2025 Number of pages: str. 95-102 Numbering: Vol. 55, no. 2 PID: 20.500.12556/DiRROS-30224  UDC: 004.43 ISSN on article: 0352-9045 DOI: 10.33180/InfMIDEM2025.203  COBISS.SI-ID: 247998211  Note: Besedilo v angl.; Publication date in DiRROS: 18.06.2026 Views: 140 Downloads: 155 Metadata:    Cite this work Plain text BibTeX EndNote XML EndNote/Refer RIS ABNT ACM Ref AMA APA Chicago 17th Author-Date Harvard IEEE ISO 690 MLA Vancouver : Copy citation

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Record is a part of a journal

Title:	Informacije MIDEM : časopis za mikroelektroniko, elektronske sestavne dele in materiale
Shortened title:	Inf. MIDEM
Publisher:	Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale
ISSN:	0352-9045
COBISS.SI-ID:	1220612

Document is financed by a project

Funder:	ARIS - Slovenian Research and Innovation Agency
Project number:	P2-0246-2019
Name:	ICT4QoL - Informacijsko komunikacijske tehnologije za kakovostno življenje

Licences

License:	CC BY 4.0, Creative Commons Attribution 4.0 International
Link:	http://creativecommons.org/licenses/by/4.0/
Description:	This is the standard Creative Commons license that gives others maximum freedom to do what they want with the work as long as they credit the author.

Secondary language

Language:	Slovenian
Title:	Vpeljava elemementov EIS v SPICE simlator vezij
Abstract:	Ta študija uvaja hipotetične vezne elemente, specifično konstantnofazni element (CPE) in ničelni red približka RC vezja (ZARC), v simulacijsko okolje SPICE za izboljšanje analize elektrokemijske impedančne spektroskopije (EIS). EIS, ključna metoda za razumevanje elektrokemijskih procesov na področjih, kot so analiza gorivnih celic, študije korozije in biomateriali, temelji na ujemanju izmerjenih impedančnih krivulj z modeli ekvivalentnih električnih vezij (EEC). Obstoječi pristopi zahtevajo strokovno znanje in znatno matematično delo, kar omejuje avtomatizacijo. Z integracijo CPE in ZARC v SPICE to delo premošča vrzel med analizo EIS in naprednimi metodologijami samodejne zasnove vezij, kar omogoča učinkovito izbiro modelov in določanje parametrov. Eksperimentalni rezultati potrjujejo natančnost implementiranih elementov skozi serijo študij primerov, ocenjenih s pomočjo Sheppardove funkcije kriterijev. Ta integracija predstavlja pomemben korak proti avtomatiziranemu prilagajanju in optimizaciji modelov EIS, z možnimi vplivi na napredek raziskav na področju elektrokemije in materialov
Keywords:	elektrokemična impedančna spektroskopija, simulatorji vezij, hipotetični elementi vezja, ekvivalentna električna vezja

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1. Informacije MIDEM

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