| Title: | A new experimental system for studying defects and deuterium lattice location in single crystals by ion beam methods |
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| Authors: | ID Punzón Quijorna, Esther, Institut "Jožef Stefan" (Author)
ID Kelemen, Mitja, Institut "Jožef Stefan" (Author)
ID Galende-Pérez, Roberto, Institut "Jožef Stefan" (Author)
ID Vavpetič, Primož, Institut "Jožef Stefan" (Author)
ID Pelicon, Primož, Institut "Jožef Stefan" (Author)
ID Markelj, Sabina, Institut "Jožef Stefan" (Author) |
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| Files: |  URL - Source URL, visit https://www.sciencedirect.com/science/article/pii/S0168583X26000819?via%3Dihub
 PDF - Presentation file, download (12,46 MB)
MD5: B3DF9688D0263E74A74750A946D9B207
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| Language: | English |
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| Typology: | 1.01 - Original Scientific Article |
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| Organization: |  IJS - Jožef Stefan Institute
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| Abstract: | A high-precision 5-axis goniometer has been installed and commissioned at the INSIBA end station of the 2 MV Tandetron accelerator at the Jožef Stefan Institute. The system provides three translational and two rotational degrees of freedom with an angular resolution of 0.01°, enabling precise sample alignment for Rutherford Backscattering Spectrometry (RBS-C) and Nuclear Reaction Analysis (NRA-C), both in channeling mode. The goniometer is equipped with a versatile sample stage allowing continuous heating up to 1470 K, liquid-nitrogen cooling, and biasing up to 500 V. A load-lock system ensures vacuum integrity during sample exchange. The system supports simultaneous data acquisition from up to five detectors. Commissioning was performed using pristine and W-ion irradiated W(111) single crystals by 10.8 MeV W ions inducing damage of 0.02 and 0.2 dpa at RT, as well as D-plasma-exposed W(100) crystals containing deuterium-decorated defects. Simultaneous RBS-C and NRA-C measurements demonstrated consistent results with benchmark data, confirming the system’s precision and stability. The setup also enables in-situ RBS-C during thermal annealing, facilitating real-time studies of defect recovery and hydrogen behaviour. This system represents a major enhancement in ion beam analysis capabilities for investigating defect dynamics and light element trapping and transport in materials. |
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| Keywords: | Tandetron, channeling |
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| Publication status: | Published |
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| Publication version: | Version of Record |
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| Submitted for review: | 17.12.2025 |
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| Article acceptance date: | 06.03.2026 |
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| Publication date: | 13.03.2026 |
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| Publisher: | Elsevier |
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| Year of publishing: | 2026 |
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| Number of pages: | str. 1-8 |
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| Numbering: | Vol. 574, [article no.] 166080 |
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| Source: | Nizozemska |
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| PID: | 20.500.12556/DiRROS-28655  |
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| UDC: | 539.1 |
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| ISSN on article: | 1872-9584 |
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| DOI: | 10.1016/j.nimb.2026.166080 |
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| COBISS.SI-ID: | 272606723 |
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| Copyright: | © 2026 The Authors. |
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| Note: | Nasl. z nasl. zaslona;
Soavtorji iz Slovenije: Mitja Kelemen, Primož Vavpetič, Primož Pelicon, Sabina Markelj;
Opis vira z dne 23. 3. 2026;
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| Publication date in DiRROS: | 27.03.2026 |
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| Views: | 147 |
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| Downloads: | 89 |
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