| Title: | Microstructure, crystalline orientation evolution and electromechanical properties of ▫$0.5Ba(Zr_{0.2}Ti_{0.8})O_3−0.5(Ba_{0.7}Ca_{0.3})TiO_3$▫ thin films on platinized sapphire |
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| Authors: | ID Konsago, Sabi William, Institut "Jožef Stefan" (Author)
ID Koblar, Maja, Institut "Jožef Stefan" (Author)
ID Žiberna, Katarina, Institut "Jožef Stefan" (Author)
ID Matavž, Aleksander, Institut "Jožef Stefan" (Author)
ID Mandal, Barnik (Author)
ID Glinšek, Sebastjan (Author)
ID Bobnar, Vid, Institut "Jožef Stefan" (Author)
ID Benčan, Andreja, Institut "Jožef Stefan" (Author)
ID Malič, Barbara, Institut "Jožef Stefan" (Author) |
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| Files: |  URL - Source URL, visit https://www.sciencedirect.com/science/article/pii/S0925838825066885?via%3Dihub
 PDF - Presentation file, download (4,39 MB)
MD5: 588986BF537A9C9283943F1D404E4D76
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| Language: | English |
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| Typology: | 1.01 - Original Scientific Article |
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| Organization: |  IJS - Jožef Stefan Institute
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| Abstract: | The microstructure and crystalline orientation evolution of manganese-doped 0.5Ba(Zr0.2Ti0.8)O3—0.5 (Ba0.7Ca0.3)TiO3 (BZT—BCT) thin films deposited on platinized sapphire and multistep-annealed at 850 ◦C are reported. The crack-free 680 nm thick BZT—BCT films with an average lateral grain size of 140 nm exhibit preferential {111} orientation on the surface confirmed by the electron backscatter diffraction (EBSD). Transmission Kikuchi diffraction (TKD) analysis reveals the evolution of preferential {111} and {110} orientation of columnar grains along the film thickness, that is, in the grain-growth direction. The formation of pores at the interface of the film and substrate is observed and related to the migration of pores and grain boundaries. The dielectric permittivity and losses of 840 and 0.02, respectively, at 1 kHz, are measured at room temperature. The maximum polarization and strain at an electric field of 1.2 MV•cm− 1 are about 32 μC•cm− 2 and 0.35 %, respectively. The piezoelectric d33 coefficient of 42 pm•V− 1 was measured by double-beam laser interferometry. |
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| Keywords: | 0.5Ba(Zr0.2Ti0.8)O3—0.5(Ba0.7Ca0.3)TiO3 thin films, mycrostructure, crystaline orientation, electromechanical properties |
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| Publication status: | Published |
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| Publication version: | Version of Record |
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| Submitted for review: | 29.08.2025 |
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| Article acceptance date: | 17.11.2025 |
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| Publication date: | 20.11.2025 |
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| Publisher: | Elsevier |
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| Year of publishing: | 2025 |
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| Number of pages: | str. 1-7 |
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| Numbering: | Vol. 1047, [article no.] 185124 |
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| Source: | Nizozemska |
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| PID: | 20.500.12556/DiRROS-25302  |
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| UDC: | 54 |
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| ISSN on article: | 1873-4669 |
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| DOI: | 10.1016/j.jallcom.2025.185124 |
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| COBISS.SI-ID: | 258844675 |
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| Copyright: | © 2025 The Authors. |
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| Note: | Nasl. z nasl. zaslona;
Soavtorji: Maja Koblar, Katarina Žiberna, Aleksander Matavž, Barnik Mandal, Sebastjan Glinšek, Vid Bobnar, Andreja Benčan, Barbara Malič;
Opis vira z dne 26. 11. 2025;
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| Publication date in DiRROS: | 15.01.2026 |
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| Views: | 141 |
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| Downloads: | 51 |
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