| Title: | Predicting image quality degradation as a result of two-phase sample transport in LA-ICP-TOFMS mapping of carbon-based materials |
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| Authors: | ID Elteren, Johannes Teun van (Author)
ID Helden, Tom Van (Author)
ID Metarapi, Dino (Author)
ID Van Acker, Thibaut (Author)
ID Mervič, Kristina (Author)
ID Šala, Martin (Author)
ID Vanhaecke, Frank (Author) |
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| Files: |  URL - Source URL, visit https://pubs.rsc.org/en/content/articlelanding/2025/ja/d4ja00288a
 PDF - Presentation file, download (2,52 MB)
MD5: 0CACF05FE050E346CF6D4F3B2A32EC63
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| Language: | English |
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| Typology: | 1.01 - Original Scientific Article |
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| Organization: |  KI - National Institute of Chemistry
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| Publication status: | Published |
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| Publication version: | Version of Record |
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| Publication date: | 01.01.2025 |
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| Publisher: | Royal Society of Chemistry |
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| Year of publishing: | 2025 |
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| Number of pages: | str. 520–528 |
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| Numbering: | Vol. 40, iss. 2 |
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| Source: | Journal of analytical atomic spectrometry |
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| PID: | 20.500.12556/DiRROS-21494  |
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| UDC: | 543 |
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| ISSN on article: | 1364-5544 |
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| DOI: | 10.1039/D4JA00288A |
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| COBISS.SI-ID: | 225601795 |
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| Copyright: | © The Royal Society of Chemistry 2025 |
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| Note: | Nasl. z nasl. zaslona;
Opis vira z dne 10. 2. 2025;
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| Publication date in DiRROS: | 12.02.2025 |
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| Views: | 659 |
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| Downloads: | 339 |
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| Metadata: |    |
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