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Title:A ǂFramework for applying data-driven AI/ML models in reliability
Authors:ID Hribar, Rok, Institut Jožef Stefan (Author)
ID Antoniou, Margarita, Institut Jožef Stefan (Author)
ID Papa, Gregor, Institut Jožef Stefan (Author)
Files:URL URL - Source URL, visit https://link.springer.com/chapter/10.1007/978-3-031-59361-1_12
 
.pdf PDF - Presentation file. (497,12 KB, This file will be accessible after 22.04.2026)
MD5: EDA00360935E968892AF14DE5913FB82
 
Language:English
Typology:1.16 - Independent Scientific Component Part or a Chapter in a Monograph
Organization:Logo IJS - Jožef Stefan Institute
Abstract:In this chapter, we present a framework for applying artificial intelligence (AI)/machine learning (ML) in reliability, in the context of the iRel40 project. Data-driven models are becoming an increasingly fruitful tool for detecting patterns in complex data and identifying the circumstances in which they occur. Using only data, gathered along the value chain, data-driven methods are now being used to detect indications of potential early failures, signs of wear out or degradation, and other unwanted events within the development, fabrication, or service phases of the electronic components and systems. We present general considerations that were found to be important during the iRel40 project, when designing pipelines that combine data processing with the AI/ML models for predicting or detecting reliability issues. This chapter serves as an introduction to the definitions and concepts used within the specific use cases that rely on the AI/ML methodology within the iRel40 project.
Keywords:machine learning, artificial intelligence, data-driven models
Publication status:Published
Publication version:Author Accepted Manuscript
Publication date:22.04.2024
Publisher:Springer
Year of publishing:2024
Number of pages:1 spletni vir (1 PDF dokument (323–337 str.))
Source:Švica
PID:20.500.12556/DiRROS-19675 New window
UDC:004.8
DOI:10.1007/978-3-031-59361-1_12 New window
COBISS.SI-ID:202399235 New window
Copyright:© 2024 The Author(s), under exclusive license to Springer Nature Switzerland AG
Note:Nasl. z nasl. zaslona; Opis vira z dne 22. 7. 2024;
Publication date in DiRROS:23.07.2024
Views:239
Downloads:96
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Record is a part of a monograph

Title:Recent Advances in Microelectronics Reliability : Contributions from the European ECSEL JU Project IRel40
Editors:Willem Dirk van Driel
Place of publishing:Cham
Publisher:Springer Nature
ISBN:978-3-031-59361-1
COBISS.SI-ID:202391555 New window

Document is financed by a project

Funder:ARIS - Slovenian Research and Innovation Agency
Project number:P2-0098
Name:Računalniške strukture in sistemi

Funder:EC - European Commission
Funding programme:H2020
Project number:876659
Name:Intelligent Reliability 4.0
Acronym:iRel40

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