Title: | Evaluation and metrological performance of a novel ionisation vacuum gauge suitable as reference standard |
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Authors: | ID Jousten, Karl (Author) ID Bechstein, Sylke (Author) ID Bernien, Matthias (Author) ID Boineau, Frédéric (Author) ID Bundaleski, N. (Author) ID Illgen, Claus (Author) ID Jenninger, Berthold (Author) ID Šetina, Janez (Author) ID Silva, Ricardo A. S. (Author) ID Stöltzel, Anke (Author) ID Teodoro, O. M. N. D. (Author) ID Wüest, Martin (Author) |
Files: | PDF - Presentation file, download (3,39 MB) MD5: 62DE74FC5735D3EF8A60079AD6C94629
URL - Source URL, visit https://www.sciencedirect.com/science/article/pii/S0263224123001161?via%3Dihub
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Language: | English |
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Typology: | 1.01 - Original Scientific Article |
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Organization: | IMT - Institute of Metals and Technology
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Keywords: | ionisation vacuum gauge, hot cathode, sensitivity, secondary electrons, ion induced secondary electron yield |
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Publication status: | Published |
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Publication version: | Version of Record |
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Publication date: | 10.02.2023 |
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Publisher: | Elsevier |
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Year of publishing: | 2023 |
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Number of pages: | str. 1-9 |
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Numbering: | Vol. 210, [article no.] 112552 |
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Source: | Nizozemska |
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PID: | 20.500.12556/DiRROS-18008 |
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UDC: | 531.788.7 |
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ISSN on article: | 0263-2241 |
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DOI: | 10.1016/j.measurement.2023.112552 |
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COBISS.SI-ID: | 181292803 |
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Copyright: | © 2023 The Author(s). Published by Elsevier Ltd. |
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Publication date in DiRROS: | 26.01.2024 |
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Views: | 360 |
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Downloads: | 156 |
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