| Title: | Application of atomic force microscopy in preparing Ni-Al layer using a two-stage process |
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| Authors: | ID Li, Ningning (Author)
ID Hao, Zhenjie (Author)
ID Xu, Lei (Author)
ID Chen, Xi (Author)
ID Peng, Jin (Author)
ID Wei, Leyu (Author)
ID Tang, Mingqi (Author)
ID Tong, Yuping (Author)
ID Ling, Zicheng (Author)
ID Li, Yimin (Author) |
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| Files: |  PDF - Presentation file, download (1,62 MB)
MD5: 0870584CA316085810FBBB4AE6EE9C18
 URL - Source URL, visit https://mater-tehnol.si/index.php/MatTech/article/view/1352
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| Language: | English |
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| Typology: | 1.01 - Original Scientific Article |
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| Organization: |  IMT - Institute of Metals and Technology
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| Keywords: | Ni-Al layer, atomic force microscopy, nickel layer, morphology |
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| Publication status: | Published |
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| Publication version: | Version of Record |
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| Publication date: | 07.04.2025 |
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| Publisher: | Inštitut za kovinske materiale in tehnologije |
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| Year of publishing: | 2025 |
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| Number of pages: | str. 261–266 |
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| Numbering: | Let. 59, št. 2 |
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| Source: | Slovenija |
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| PID: | 20.500.12556/DiRROS-22108  |
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| UDC: | 622.031.2:543.456 |
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| ISSN on article: | 1580-2949 |
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| DOI: | 10.17222/mit.2024.1352 |
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| COBISS.SI-ID: | 233964291 |
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| Copyright: | © 2025 The Author(s) |
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| Publication date in DiRROS: | 24.04.2025 |
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| Views: | 524 |
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| Downloads: | 312 |
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| Metadata: |    |
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