Digital repository of Slovenian research organisations

Show document
A+ | A- | Help | SLO | ENG

Title:Effects of hydrogen dissociation during gas flooding on formation of metal hydride cluster ions in secondary ion mass spectrometry
Authors:ID Ekar, Jernej, Institut Jožef Stefan (Author)
ID Markelj, Sabina, Institut Jožef Stefan (Author)
ID Mozetič, Miran, Institut Jožef Stefan (Author)
ID Zaplotnik, Rok, Institut Jožef Stefan (Author)
ID Kovač, Janez, Institut Jožef Stefan (Author)
Files:URL URL - Source URL, visit https://www.mdpi.com/2079-4991/14/21/1687
 
.pdf PDF - Presentation file, download (1,18 MB)
MD5: 3A4FC6DB2611BEE4E8F4B5C0E229FDE5
 
Language:English
Typology:1.01 - Original Scientific Article
Organization:Logo IJS - Jožef Stefan Institute
Abstract:The application of hydrogen flooding was recently shown to be a simple and effective approach for improved layer differentiation and interface determination during secondary ion mass spectrometry (SIMS) depth profiling of thin films, as well as an approach with potential in the field of quantitative SIMS analyses. To study the effects of hydrogen further, flooding of H2 molecules was compared to reactions with atomic H on samples of pure metals and their alloys. H2 was introduced into the analytical chamber via a capillary, which was heated to approximately 2200 K to achieve dissociation. Dissociation of H2 up to 30% resulted in a significant increase in the intensity of the metal hydride cluster secondary ions originating from the metallic samples. Comparison of the time scales of possible processes provided insight into the mechanism of hydride cluster secondary ion formation. Cluster ions presumably form during the recombination of the atoms and molecules from the sample and atoms and molecules adsorbed from the gas. This process occurs on the surface or just above it during the sputtering process. These findings coincide with those of previous mechanistic and computational studies.
Keywords:hydrogen atmosphere, molecule dissociation, gas flooding, cluster ions, secondary ion mass spectrometry
Publication status:Published
Publication version:Version of Record
Submitted for review:24.09.2024
Article acceptance date:18.10.2024
Publication date:22.10.2024
Publisher:MDPI
Year of publishing:2024
Number of pages:str. 1-15
Numbering:Vol. 14, iss. 21, [article no.] 1687
Source:Švica
PID:20.500.12556/DiRROS-20801 New window
UDC:620.1/.2
ISSN on article:2079-4991
DOI:10.3390/nano14211687 New window
COBISS.SI-ID:212778499 New window
Copyright:© 2024 by the authors.
Note:Nasl. z nasl. zaslona; Soavtorji: Sabina Markelj, Miran Mozetič, Rok Zaplotnik, Janez Kovač; Opis vira z dne 24. 10. 2024;
Publication date in DiRROS:08.11.2024
Views:85
Downloads:44
Metadata:XML DC-XML DC-RDF
:
Copy citation
  
Share:Bookmark and Share


Hover the mouse pointer over a document title to show the abstract or click on the title to get all document metadata.

Record is a part of a journal

Title:Nanomaterials
Shortened title:Nanomaterials
Publisher:MDPI AG
ISSN:2079-4991
COBISS.SI-ID:523286297 New window

Licences

License:CC BY 4.0, Creative Commons Attribution 4.0 International
Link:http://creativecommons.org/licenses/by/4.0/
Description:This is the standard Creative Commons license that gives others maximum freedom to do what they want with the work as long as they credit the author.
Licensing start date:22.10.2024
Applies to:VoR

Back