| Title: | Dielectric loss of Si[sub]2N[sub]2O and the influence of Li on its properties |
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| Authors: | ID Yang, Yong (Author)
ID He, Ming (Author)
ID Zhang, Ting (Author)
ID Wu, Meng-qiang (Author) |
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| Files: |  URL - Source URL, visit https://mater-tehnol.si/index.php/MatTech/article/view/334/132
URL - Source URL, visit https://mater-tehnol.si/index.php/MatTech/article/view/334
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| Language: | English |
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| Typology: | 1.01 - Original Scientific Article |
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| Organization: |  IMT - Institute of Metals and Technology
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| Keywords: | Si2N2O, dielectric loss, high temperature, Li doping |
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| Year of publishing: | 2022 |
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| Number of pages: | str. 79-84 |
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| Numbering: | Letn. 56, št. 1 |
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| PID: | 20.500.12556/DiRROS-15188  |
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| UDC: | 537.226.3:661.687 |
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| ISSN on article: | 1580-2949 |
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| DOI: | 10.17222/mit.2021.334 |
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| COBISS.SI-ID: | 109957379 |
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| Publication date in DiRROS: | 22.06.2022 |
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| Views: | 801 |
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| Downloads: | 378 |
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| Metadata: |    |
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