Title: | Dielectric loss of Si[sub]2N[sub]2O and the influence of Li on its properties |
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Authors: | ID Yang, Yong (Author) ID He, Ming (Author) ID Zhang, Ting (Author) ID Wu, Meng-qiang (Author) |
Files: | URL - Source URL, visit https://mater-tehnol.si/index.php/MatTech/article/view/334/132
URL - Source URL, visit https://mater-tehnol.si/index.php/MatTech/article/view/334
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Language: | English |
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Typology: | 1.01 - Original Scientific Article |
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Organization: | IMT - Institute of Metals and Technology
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Keywords: | Si2N2O, dielectric loss, high temperature, Li doping |
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Year of publishing: | 2022 |
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Number of pages: | str. 79-84 |
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Numbering: | Letn. 56, št. 1 |
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PID: | 20.500.12556/DiRROS-15188 ![Link is opened in a new window New window](teme/dirros/img/NovoOkno.png) |
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UDC: | 537.226.3:661.687 |
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ISSN on article: | 1580-2949 |
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DOI: | 10.17222/mit.2021.334 ![Link is opened in a new window New window](teme/dirros/img/NovoOkno.png) |
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COBISS.SI-ID: | 109957379 ![Link is opened in a new window New window](teme/dirros/img/NovoOkno.png) |
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Publication date in DiRROS: | 22.06.2022 |
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Views: | 673 |
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Downloads: | 317 |
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Metadata: | ![Export as DC-RDF DC-RDF](teme/dirros/img/icon_dc_rdf.gif) |
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