| Title: | Dielectric loss of Si[sub]2N[sub]2O and the influence of Li on its properties |
|---|
| Authors: | ID Yang, Yong (Author)
ID He, Ming (Author)
ID Zhang, Ting (Author)
ID Wu, Meng-qiang (Author) |
|---|
| Files: |  URL - Source URL, visit https://mater-tehnol.si/index.php/MatTech/article/view/334
URL - Source URL, visit https://mater-tehnol.si/index.php/MatTech/article/view/334/132
|
|---|
| Language: | English |
|---|
| Typology: | 1.01 - Original Scientific Article |
|---|
| Organization: |  IMT - Institute of Metals and Technology
|
|---|
| Keywords: | Si2N2O, dielectric loss, high temperature, Li doping |
|---|
| Year of publishing: | 2022 |
|---|
| Number of pages: | str. 79-84 |
|---|
| Numbering: | Letn. 56, št. 1 |
|---|
| PID: | 20.500.12556/DiRROS-15188  |
|---|
| UDC: | 537.226.3:661.687 |
|---|
| ISSN on article: | 1580-2949 |
|---|
| DOI: | 10.17222/mit.2021.334 |
|---|
| COBISS.SI-ID: | 109957379 |
|---|
| Publication date in DiRROS: | 22.06.2022 |
|---|
| Views: | 1339 |
|---|
| Downloads: | 773 |
|---|
| Metadata: |    |
|---|
|
:
|
Copy citation |
|---|
| | | | Share: |  |
|---|
Hover the mouse pointer over a document title to show the abstract or click
on the title to get all document metadata. |
