Title: | Electrons on a straight path : ǂa ǂnovel ionisation vacuum gauge suitable as reference standard |
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Authors: | ID Jousten, Karl (Author) ID Bernien, Matthias (Author) ID Boineau, Frédéric (Author) ID Bundaleski, N. (Author) ID Illgen, Claus (Author) ID Jenninger, Berthold (Author) ID Jönsson, Gustav (Author) ID Šetina, Janez (Author) ID Teodoro, O. M. N. D. (Author) ID Vičar, Martin (Author) |
Files: | URL - Source URL, visit https://www.sciencedirect.com/science/article/pii/S0042207X21001949?via%3Dihub
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Language: | English |
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Typology: | 1.01 - Original Scientific Article |
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Organization: | IMT - Institute of Metals and Technology
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Keywords: | ionisation vacuum gauge, hot cathode, sensitivity, secondary electrons, ion induced secondary electron yield |
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Year of publishing: | 2021 |
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Number of pages: | str. 1-7 |
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Numbering: | Vol. 189, article 1110239 |
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PID: | 20.500.12556/DiRROS-15062 |
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UDC: | 531.788.7 |
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ISSN on article: | 0042-207X |
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DOI: | 10.1016/j.vacuum.2021.110239 |
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COBISS.SI-ID: | 95756547 |
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Publication date in DiRROS: | 06.05.2022 |
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Views: | 816 |
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Downloads: | 299 |
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