Keywords: Ions, Layers, Mass spectrometry, Metals, Oxides, SIMS depth profiling H2 C2H2 CO and O2 atmosphere gas flooding cluster secondary ions matrix effectPublished in DiRROS: 18.10.2023; Views: 359; Downloads: 158 Full text (8,02 MB)This document has many files! More...
Keywords: laser ablation, microanalysis, depth profiling, bulk composition, internal standardization, glass densityPublished in DiRROS: 15.04.2015; Views: 4634; Downloads: 455 Link to file