20.500.12556/DiRROS-798 Laser ablation-ICP-MS depth profiling to study ancient glass surface degradation laser ablation microanalysis depth profiling bulk composition internal standardization glass density materiali steklo mikroanalize lastnosti true true true Angleški jezik Ni določen Članek v reviji 2015-04-15 10:27:41 2015-04-15 10:58:55 2022-08-10 03:32:44 0000-00-00 00:00:00 0 0 0 Soavtorji: Johannes T. Van Elteren, Emilio F. Orsega, Ligia M. Moretto Nasl. z nasl. zaslona Opis vira z dne 27. 3. 2015 3377-3391 no. 12 Vol. 407 May 2015 0000-00-00 NiDoloceno Objavljeno NiDoloceno 0000-00-00 0000-00-00 0000-00-00 620.1/.2 1618-2650 10.1007/s00216-015-8568-7 37877253 2520852 http://link.springer.com/article/10.1007%2Fs00216-015-8568-7 1 https://dirros.openscience.si/Dokument.php?lang=slv&id=895 Kemijski inštitut 0 0 0