20.500.12556/DiRROS-28517 Ion-specific kinetic energy distributions in MeV-SIMS insights into electronic sputtering processes Kinetic energy distributions of secondary ions produced by fast heavy primary ions (3 – 10 MeV 35Cl, charge states 4+, 5+ and 7+) were measured to interpret the dynamics of ion desorption and formation under electronic stopping regime. All measurements were done on organic targets, such as various amino-acids and polymers, and were conducted using a reflectron mass spectrometer with a reflector electrode used as a tool to discriminate ions below the selected kinetic energy. Typical average kinetic energies of molecular ions range from 0.5 to 5 eV, with some smaller monoatomic ions or ion clusters, such as H+ and H2+, exceeding 5 eV in average energy and exhibiting broader distributions. The type of cation was found to significantly affect kinetic energy distributions of organic molecules, with Ag adducts resulting in significantly lower kinetic energies and more pronounced “negative tailing” than e.g. protonated species. Systematic measurements across different target voltages ruled out gas-phase ion formation as a significant source of this tailing, which is more likely due to strong surface interactions or delayed ejection dynamics, specific to several secondary ion species. Additionally, fragmentation was found as a source of redistribution of internal energy into translational motion. On the other hand, the primary ion energy did not significantly affect the kinetic energy distributions of any analyzed species, thus confirming the dominance of the electronic stopping over nuclear stopping within the selected primary ion energy domain. masna spektrometrija sekundarni ioni true false true Elsevier Nizozemska Angleški jezik Slovenski jezik © 2026 The Authors. Neznano 2026-03-23 12:16:23 2026-03-23 12:16:23 2026-03-26 04:03:01 0000-00-00 00:00:00 2026 0 0 1-6 str. Vol. 524 Jun. 2026 0000-00-00 Zaloznikova Objavljeno NiDoloceno 2025-11-19 2026-03-14 2026-03-15 53 1387-3806 10.1016/j.ijms.2026.117609 272581379 https://www.sciencedirect.com/science/article/pii/S1387380626000400?via%3Dihub 1 bb66bb23-26a9-11f1-aa40-001a4af901a5 https://dirros.openscience.si/Dokument.php?lang=slv&id=42291 RAZ_Jencic_Bostjan_2026.pdf RAZ_Jencic_Bostjan_2026.pdf 1 98E0FF4348761DE2FEF69A2260ED3D1E 9da2b0e1c2d1377960ecf5f67203786bd75753516dbdd45a042760b97416fc78 13f6a02b-26aa-11f1-aa40-001a4af901a5 https://dirros.openscience.si/Dokument.php?lang=slv&id=42292 Institut Jožef Stefan 0 0 0