20.500.12556/DiRROS-17172 AFM study of roughness development during ToF-SIMS depth profiling of multilayers with a ▫$Cs^+$▫ ion beam in a ▫$H_2$▫ atmosphere true false true ACS Publications ZDA Angleški jezik Ni določen © 2022 The Authors Neznano 2023-10-18 07:52:30 2023-10-18 07:52:30 2023-10-19 03:37:08 0000-00-00 00:00:00 2022 0 0 str. 12871–12880 no. 42 Vol. 38 2022 0000-00-00 Zaloznikova Objavljeno NiDoloceno 2023-07-13 0000-00-00 2022-10-14 53 0743-7463 10.1021/acs.langmuir.2c01837 128549635 https://pubs.acs.org/doi/10.1021/acs.langmuir.2c01837 0 a4c96133-6d6a-11ee-8cc8-001a4af901a5 https://dirros.openscience.si/Dokument.php?lang=slv&id=23303 RAZ_Ekar_Jernej_2022.pdf RAZ_Ekar_Jernej_2022.pdf 1 517BD00514FFA332B779285C11855CD6 5d84c211af5b030976741cbfb573e7a4b70f6eefbac4a4e1e6101ddc37c88958 b679b7b8-6d6a-11ee-8cc8-001a4af901a5 https://dirros.openscience.si/Dokument.php?lang=slv&id=23304 Institut Jožef Stefan 0 0 0