Analysis and mitigation of negative differential resistance effects with hetero-gate dielectric layer in negative-capacitance field-effect transistorsHuo, Honglei (Avtor) 20242026-06-09 08:03:11Neznano29866UDK: 621.382.3ISSN pri članku: 0352-9045DOI: 10.33180/InfMIDEM2024.106COBISS_ID: 245622787sl