Predicting image quality degradation as a result of two-phase sample transport in LA-ICP-TOFMS mapping of carbon-based materialsElteren, Johannes Teun van (Avtor) Helden, Tom Van (Avtor) Metarapi, Dino (Avtor) Van Acker, Thibaut (Avtor) Mervič, Kristina (Avtor) Šala, Martin (Avtor) Vanhaecke, Frank (Avtor) Royal Society of Chemistry20252025-02-12 13:10:18Neznano21494UDK: 543ISSN pri članku: 1364-5544DOI: 10.1039/D4JA00288ACOBISS_ID: 225601795Journal of analytical atomic spectrometrysl© The Royal Society of Chemistry 2025