Dielectric loss of Si[sub]2N[sub]2O and the influence of Li on its propertiesYang, Yong (Avtor) He, Ming (Avtor) Zhang, Ting (Avtor) Wu, Meng-qiang (Avtor) Si2N2Odielectric losshigh temperatureLi doping20222022-06-22 08:50:57Neznano15188UDK: 537.226.3:661.687ISSN pri članku: 1580-2949DOI: 10.17222/mit.2021.334COBISS_ID: 109957379sl