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<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:dc="http://purl.org/dc/elements/1.1/"><rdf:Description rdf:about="https://dirros.openscience.si/IzpisGradiva.php?id=21494"><dc:title>Predicting image quality degradation as a result of two-phase sample transport in LA-ICP-TOFMS mapping of carbon-based materials</dc:title><dc:creator>Elteren,	Johannes Teun van	(Avtor)
	</dc:creator><dc:creator>Helden,	Tom Van	(Avtor)
	</dc:creator><dc:creator>Metarapi,	Dino	(Avtor)
	</dc:creator><dc:creator>Van Acker,	Thibaut	(Avtor)
	</dc:creator><dc:creator>Mervič,	Kristina	(Avtor)
	</dc:creator><dc:creator>Šala,	Martin	(Avtor)
	</dc:creator><dc:creator>Vanhaecke,	Frank	(Avtor)
	</dc:creator><dc:publisher>Royal Society of Chemistry</dc:publisher><dc:date>2025</dc:date><dc:date>2025-02-12 13:10:18</dc:date><dc:type>Neznano</dc:type><dc:identifier>21494</dc:identifier><dc:source>Journal of analytical atomic spectrometry</dc:source><dc:language>sl</dc:language><dc:rights>© The Royal Society of Chemistry 2025</dc:rights></rdf:Description></rdf:RDF>